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Object identification using tagger #209

Answered by jackaraz
abhika2s asked this question in Q&A
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Hi @abhika2s, all the simulation you see in that paper has been tuned to match the default Delphes cards. The smearing parameterization changes for every analysis; hence should be checked with respect to the analysis that you are taking as the basis. Each experimental analysis refers to specific fit parameters for tagging, which can be used in a recast.

The detector simulation in SFS is designed to work with showered and hadronised event samples not with matrix element-level events.

cheers

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